| US11874237B2 | 16 January 2024 | Grant | US17114842 | System and method for measuring a sample by x-ray reflectance scatterometry | Nova Ltd |
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| US11852467B2 | 26 December 2023 | Grant | US17438845 | Method and system for monitoring deposition process | Nova Ltd |
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| US11823883B2 | 21 November 2023 | Grant | US17531674 | Mass spectrometer detector and system and method using the same | Nova Ltd |
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| US11764050B2 | 19 September 2023 | Grant | US17821785 | Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry | Nova Ltd |
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| US11733035B2 | 22 August 2023 | Grant | US17303834 | Feed-forward of multi-layer and multi-process information using xps and xrf technologies | Nova Ltd |
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